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＜Books＞
Neutron and X-ray microscopy / by Jay Theodore Cremer, Jr
(Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 172, 173)
| Material Type | Books |
|---|---|
| Publisher | Amsterdam : Academic Press |
| Classification | DC23:621.367 |
| Year | 2012 |
| Size | 2 v. : ill. (some col.) ; 24 cm |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
|---|---|---|---|---|---|---|
| 3F | pt. 1 | 540A||Adv||172 | 50018175 |
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| 3F | pt. 2 | 540A||Adv||173 | 50018282 |
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| Notes | Includes bibliographical references and index |
|---|---|
| Authors | *Cremer, Jay Theodore |
| Subjects | LCSH:Optoelectronic devices LCSH:Optical data processing |
| ID | 1000079442 |
| NCID | BB09671593 |