<Books>
Neutron and X-ray microscopy / by Jay Theodore Cremer, Jr
(Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 172, 173)
Material Type | Books |
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Publisher | Amsterdam : Academic Press |
Classification | DC23:621.367 |
Year | 2012 |
Size | 2 v. : ill. (some col.) ; 24 cm |
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Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
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3F | pt. 1 | 540A||Adv||172 | 50018175 |
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3F | pt. 2 | 540A||Adv||173 | 50018282 |
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Notes | Includes bibliographical references and index |
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Authors | *Cremer, Jay Theodore |
Subjects | LCSH:Optoelectronic devices LCSH:Optical data processing |
ID | 1000079442 |
NCID | BB09671593 |