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Transmission electron microscopy : diffraction, imaging, and spectrometry / C. Barry Carter, David B. Williams (eds.) ; [foreword by Sir John Meurig Thomas]
| Material Type | Books |
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| Publisher | Berlin : Springer |
| Year | c2016 |
| Size | xxxiii, 518 p. : ill. (some col.), ports. ; 29 cm |
| URL |
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| Notes | "This text is a companion volume to Transmission electron microscopy : a textbook for materials sciences by Williams and Carter."--P. [4] of cover Includes bibliographical references and index |
|---|---|
| Authors | Carter, C. Barry *Williams, David B. (David Bernard), 1949- Thomas, J. M. (John Meurig) |
| ID | 1000087836 |
| NCID | BB22301599 |