<Books>
Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State / Andreas Rosenauer
(Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler ; v. 182)
(Physics and astronomy online library)
Material Type | Books |
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Publisher | Berlin : Springer |
Year | c2003 |
Size | xii, 238 p. : ill. ; 24 cm |
URL |
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Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
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3F |
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420||Erg||182 | 50009232 |
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Notes | Includes bibliographical references and index |
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Authors | Andreas Rosenauer |
ID | 1000065863 |
NCID | BA61398367 |