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＜図書＞
Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State / Andreas Rosenauer
(Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler ; v. 182)
(Physics and astronomy online library)

データ種別	図書
出版者	Berlin : Springer
出版年	c2003
大きさ	xii, 238 p. : ill. ; 24 cm
URL