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検索キーワード：(件名: #Analysis)
該当件数:26件
Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer
New York : North-Holland : Elsevier Science Pub. , c1986
図書
A handbook of silicate rock analysis / P.J. Potts
: uk - : u.s.. - Glasgow : Blackie. - New York : Chapman and Hall , 1987
Tritium measurement techniques : recommendations of the National Council on Radiation Protection and Measurements
Washington : The Council , 1976. - (NCRP report ; no. 47)
Methods of surface analysis / edited by A. W. Czanderna
Amsterdam ; New York : Elsevier Scientific Pub. Co. , 1975. - (Methods and phenomena, their applications in science and technology ; v. 1)
Methods of surface analysis / edited by J.M. Walls
Cambridge [Cambridgeshire] ; New York : Cambridge University Press , 1989
Analysis of high temperature materials / edited by O. van der Biest
London ; New York : Applied Science Publishers , c1983
Auger and x-ray photoelectron spectroscopy / edited by D. Briggs and M.P. Seah
: Wiley - : paper. - 2nd ed. - Chichester, West Sussex, England ; New York : Wiley. - Frankfurt am Main : Salle. - Aarau : Sauerlander , c1990. - (Practical surface analysis ; v. 1)
Surface analytical techniques / J.C. Rivière
Oxford [England] : Clarendon Press. - New York : Oxford University Press , 1990. - (Monographs on the physics and chemistry of materials)
Spectroscopic analysis of gas mixtures / [by] O.P. Bochkova and E. Ya. Shreyder. Edited by S.E. Frisch. Translation editor: Charles P. Poole, Jr
New York : Academic Press , 1965
Методы анализа на пучках заряженных частиц / А.А. Ключников ... [et al.]
Киев : Наукова думка , 1987
Electron spectroscopy for surface analysis / edited by H. Ibach ; with contributions by J. D. Carette ... [et al.]
: us,: gw. - Berlin ; New York : Springer-Verlag , 1977. - (Topics in current physics ; v. 4)
Analytical methods, high melting metals / with contributions by G.S. Burkhanov ... [et al.]
: U.S.,: Germany. - Berlin ; New York : Springer-Verlag , 1982. - (Crystals : growth, properties, and applications ; 7)
Auger microprobe analysis / I.F. Ferguson
Bristol, England ; New York : A. Hilger , c1989
Practical surface analysis : by auger and X-ray photo-electron spectroscopy / edited by D. Briggs and M.P. Seah
Chichester ; New York : Wiley , c1983
Surface analysis of high temperature materials : chemistry and topography / edited by G. Kemeny
London : Elsevier Applied Science , c1984
Industrial applications of surface analysis / Lawrence A. Casper, editor, Cedric J. Powell, editor
Washington, D.C. : American Chemical Society , 1982. - (ACS symposium series ; 199)
Physical properties and data of optical materials / Moriaki Wakaki, Keiei Kudo, Takehisa Shibuya
: hardcover. - Boca Raton : CRC Press, Taylor & Francis Group , c2007. - (Optical science and engineering ; 125)
Electron beam analysis of materials / M.H. Loretto
London ; New York : Chapman and Hall , 1984.
Material characterization using ion beams / edited by J.P. Thomas and A. Cachard
London ; New York : Plenum Press , c1978. - (NATO advanced study institutes series ; ser. B . Physics ; v. 28)
Methods of air sampling and analysis
3rd ed. / James P. Lodge, Jr., editor. - Chelsea, Mich. : Lewis Publishers , c1989
