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検索キーワード:(件名: #electron microscopy)
該当件数:14件
Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy
New York : Plenum Press , c1979
図書
Principles of analytical electron microscopy / edited by David C. Joy, Alton D. Romig, Jr. and Joseph I. Goldstein
New York : Plenum Press , c1986
Computer techniques for image processing in electron microscopy / edited by Martin Hÿtch and Peter W. Hawkes
London : Academic Press , 2020. - (Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 214)
The Beginnings of electron microscopy / edited by Peter W. Hawkes
Orlando : Academic Press , 1985. - (Advances in electronics and electron physics ; Supplement 16)
In memory of Akira Tonomura : physicist and electron microscopist / editors, Kazuo Fujikawa, Yoshimasa A. Ono
: hardcover,: pbk,: DVD-ROM. - Hackensack, NJ : World Scientific , c2014
Electron energy-loss spectroscopy in the electron microscope / R.F. Egerton
Experimental high-resolution electron microscopy / John C. H. Spence
Oxford : Clarendon Press , 1981. - New York : Oxford University Press , 1980. - (Monographs on the physics and chemistry of materials)
Superconducting electron-optic devices / I. Dietrich
New York : Plenum Press , c1976. - (The International cryogenics monograph series)
Computer techniques for image processing in electron microscopy / W. O. Saxton
New York : Academic Press , 1978. - (Advances in electronics and electron physics ; Supplement 10)
Computed electron micrographs and defect identification / A. K. Head ... [et al.]
American Elsevier. - Amsterdam ; London : North-Holland. - New York : American Elsevier , 1973. - (Defects in crystalline solids ; v. 7)
Electron beam analysis of materials / M.H. Loretto
London ; New York : Chapman and Hall , 1984.
Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt
set,v. 1,v. 2. - 2d, rev. ed. - Amsterdam ; New York : North-Holland : sole distributors for the U.S.A. and Canada, Elsevier North-Holland , 1978
Microscopy, spectroscopy, holography and crystallography with electrons / edited by Peter W. Hawkes ; guest editors, Pier Georgio Merli, Gianluca Calestani, Marco Vittori-Antisari
Amsterdam : Academic , c2002. - (Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 123)
Examining the submicron world / edited by Ralph Feder, J. Wm. McGowan and Douglas M. Shinozaki
New York : Plenum Press , c1986. - (NATO ASI series ; ser. B . Physics ; v. 137)