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RT Book, Whole SR Print DC OPAC T1 Markov random field modeling in image analysis / Stan Z. Li T2 Advances in pattern recognition A1 Li, S. Z. YR 2010 FD c2010 VO : pbk. SP xxiii, 357 p. K1 Image processing -- Digital techniques -- Mathematical models K1 Markov random fields ED 3rd ed PB Springer PP London SN 9781849967679 LA English (英語) CL DC22:621.36701519233 NO Includes bibliographical references (p. 315-350) and index NO 書誌ID=1100000588; NCID=BC17004070; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1100000588 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BC17004070; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=9781849967679 OL 30