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RT Book, Whole SR Print DC OPAC T1 Aberration-corrected electron microscopy / edited by Peter W. Hawkes T2 Advances in imaging and electron physics / edited by Peter W. Hawkes A1 Hawkes, P. W. (Peter William), 1937- YR 2008 FD 2008 SP xv, 538 p., [32] p. of plates PB Elsevier Academic Press PP Amsterdam ; Tokyo SN 9780123742209 LA English (英語) NO Includes bibliographical references and index NO 書誌ID=1000078623; NCID=BA88259270; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000078623 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA88259270; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=9780123742209 OL 30