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RT Book, Whole SR Print DC OPAC T1 Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt A1 Amelinckx, Severin A1 Gevers, R. A1 Landuyt, J. van A1 International Summer Course on Material Science YR 1978 FD 1978 VO set VO v. 1 VO v. 2 SP 2 v. (xvii, 847 p., [1] fold. leaf of plate) K1 Electron microscopy -- Congresses K1 Electrons -- Diffraction -- Congresses K1 Imaging systems -- Congresses ED 2d, rev. ed PB North-Holland : sole distributors for the U.S.A. and Canada, Elsevier North-Holland PP Amsterdam ; New York SN 0444851305 SN 0444851283 SN 0444851291 LA English (英語) CL LCC:TA417.23 CL DC:620.1/127 NO Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science NO Includes bibliographical references and index NO 書誌ID=1000056875; NCID=BA02904572; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000056875 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA02904572; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=0444851305 OL 30