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RT Book, Whole SR Print DC OPAC T1 Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 / editors, A. Benninghoven ... [et al.] T2 Springer series in chemical physics A1 *International Conference on Secondary Ion Mass Spectrometry A1 Benninghoven, A. YR 1986 FD c1986 VO : gw SP xxi, 561 p. K1 Secondary ion mass spectrometry -- Congresses PB Springer-Verlag PP Berlin ; Tokyo SN 3540162631 SN 0387162631 LA English (英語) CL LCC:QD96.S43 CL DC19:539/.6/028 NO Includes bibliographies and index NO 書誌ID=1000045289; NCID=BA00846599; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000045289 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA00846599; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=3540162631 OL 30