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RT Book, Whole SR Print DC OPAC T1 An artificial intelligence approach to test generation / by Narinder Singh T2 The Kluwer international series in engineering and computer science A1 *Singh, Narinder, 1956- YR 1987 FD c1987 SP x, 193 p. K1 Integrated circuits -- Very large scale integration -- Testing -- Data processing K1 Expert systems (Computer science) K1 Artificial intelligence PB Kluwer Academic Publishers PP Boston SN 0898381851 LA English (英語) CL LCC:TK7874 CL DC19:621.395 NO Bibliography: p. [189]-193 NO 書誌ID=1000045279; NCID=BA00802083; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000045279 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA00802083; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=0898381851 OL 30