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RT Book, Whole SR Print DC OPAC T1 Computed electron micrographs and defect identification / A. K. Head ... [et al.] T2 Defects in crystalline solids A1 Head, A. K. YR 1973 FD 1973 VO American Elsevier SP x, 400 p. with illus K1 Metals -- Defects -- Data processing K1 Electron microscopy -- Data processing PB North-Holland PB American Elsevier PP Amsterdam ; London PP New York SN 0720417570 SN 0444104623 LA English (英語) CL LCC:QD921 CL DC:548/.842/02854 NO Bibliography: p. [387]-389 NO 書誌ID=1000014632; NCID=BA07250178; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000014632 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA07250178; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=0720417570 OL 30