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RT Book, Whole SR Print DC OPAC T1 Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer A1 *Feldman, Leonard C. A1 Mayer, James W., 1930- YR 1986 FD c1986 SP xviii, 352 p. K1 Surfaces (Technology) -- Analysis K1 Thin films -- Analysis PB North-Holland : Elsevier Science Pub. PP New York SN 0444009892 LA English (英語) CL LCC:QD506 CL DC19:530.4/1 NO Includes bibliographies and index NO 書誌ID=1000012942; NCID=BA0028903X; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000012942 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA0028903X; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=0444009892 OL 30