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RT Magazine Article SR Print DC OPAC T1 IEEE transactions on reliability / Institute of Electrical and Electronics Engineers A1 Institute of Electrical and Electronics Engineers YR 1963 VO 12 (1963)- K1 Electronic industries -- Quality control -- Periodicals PP New York SN 00189529 LA English (英語) NO BIBID=2000000341; NCID=AA00668109; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/2000000341 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=eng&txt_docid=NCID:AA00668109; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/en/EqualFromForm?hdn_if_lang=eng&txt_isbn=00189529 OL 30