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RT Book, Whole SR Print DC OPAC T1 Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors, A. Benninghoven ... [et al.] T2 Springer series in chemical physics A1 Benninghoven, A. A1 International Conference on Secondary Ion Mass Spectrometry YR 1983 FD 1984 VO U.S. VO G.W. SP xv, 503 p. K1 Secondary ion mass spectrometry -- Congresses PB Springer Verlag PP Berlin ; New York SN 038713316X SN 354013316X LA English (英語) CL LCC:QD96.S43 CL DC19:543/.0873 NO "Fourth International Conference on Secondary Ion Mass Spectrometry]"--Pref NO Includes bibliographical references and index NO BIBID=1000055233; NCID=BA06696320; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000055233 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=eng&txt_docid=NCID:BA06696320; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/en/EqualFromForm?hdn_if_lang=eng&txt_isbn=038713316X OL 30