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RT Book, Whole SR Print DC OPAC T1 Integrated circuit technology : instrumentation and techniques for measurement, process, and failure analysis / edited by Seymour Schwartz A1 *Schwartz, Seymour YR 1967 FD c1967 SP xxii, 340 p K1 Integrated circuits -- Addresses, essays, lectures PB McGraw-Hill PP New York LA English (英語) CL LCC:TK7874 CL DC:621.3817 NO Includes bibliographies and index NO BIBID=1000016745; NCID=BA10989129; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000016745 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=eng&txt_docid=NCID:BA10989129 OL 30