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RT Book, Whole SR Print DC OPAC T1 Secondary ion mass spectrometry : SIMS III : proceedings of the third international conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 / editors, A. Benninghoven ... [et al.] T2 Springer series in chemical physics A1 Benninghoven, A. A1 International Conference on Secondary Ion Mass Spectrometry YR 1982 FD 1982 VO : U.S. VO : Ger. SP xi, 444 p. K1 Secondary ion mass spectrometry -- Congresses PB Springer Verlag PP Berlin ; New York SN 038711372X SN 354011372X LA English (英語) CL LCC:QD96.S43 CL DC19:543/.0873 NO "Third International Conference on Secondary Ion Mass Spectroscopy [i.e. Spectrometry]"--Pref NO Includes bibliographical references and index NO BIBID=1000015780; NCID=BA03030624; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000015780 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=eng&txt_docid=NCID:BA03030624; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/en/EqualFromForm?hdn_if_lang=eng&txt_isbn=038711372X OL 30