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RT Book, Whole SR Print DC OPAC T1 Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 / editors: A.Benninghoven...[et al.] T2 Springer series in chemical physics A1 International Conference on Secondary Ion Mass Spectrometry A1 Benninghoven, A. YR 1979 FD 1979 VO U.S. VO Berlin SP xiii, 295 p. K1 Secondary ion mass spectrometry -- Congresses PB Springer-Verlag PP Berlin SN 0387098437 SN 3540098437 LA English (英語) CL LCC:QD96.S43 CL DC19:543/.0873 NO Includes bibliographies and index NO 書誌ID=1000045177; NCID=BA00565104; LK [OPAC]https://libop-nifs.nifs.ac.jp/opac/opac_link/bibid/1000045177 LK [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/DocDetail?hdn_if_lang=jpn&txt_docid=NCID:BA00565104; [Webcat Plus]http://webcatplus-equal.nii.ac.jp/libportal/EqualFromForm?txt_isbn=0387098437 OL 30