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<図書>
Advances in imaging and electron physics / edited by Peter W. Hawkes

データ種別 図書
出版者 San Diego ; Tokyo : Academic Press
出版年 1995-
大きさ v. : ill. (some col.) ; 24 cm

所蔵情報を非表示

3F v. 91 540A||Adv||91 10081990
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3F v. 100, partial cumulative index 540A||Adv||100 50000652
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3F v. 104 : cumulative index 540A||Adv||104 50002765
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子書誌情報を非表示

1 v. 96 The growth of electron microscopy / edited by Tom Mulvey San Diego : Academic Press , c1996
2 v. 108 Modern map methods in particle beam physics / Martin Berz San Diego : Academic Press , c1999
3 v. 116 Numerical field calculation for charged particle optics / Erwin Kasper San Diego : Academic Press , c2001
4 v. 119 Aspects of image processing and compression / ed. by Peter W. Hawkes San Diego : Academic Press , c2001
5 v. 121, 122 Electron microscopy and holography / ed. by Peter W. Hawkes [1],2. - San Diego : Academic Press , c2002
6 v. 123 Microscopy, spectroscopy, holography and crystallography with electrons / edited by Peter W. Hawkes ; guest editors, Pier Georgio Merli, Gianluca Calestani, Marco Vittori-Antisari Amsterdam : Academic , c2002
7 v. 129 Calculus of finite differences in quantum electrodynamics / Henning F. Harmuth, Beate Meffert Amsterdam : Academic Press , 2003
8 v. 133 Sir Charles Oatley and the scanning electron microscope / edited by Bernard C. Breton, Dennis McMullan, Kenneth C.A. Smith San Diego : Academic Press , c2004
9 v. 137 Dogma of the continuum and the calculus of finite differences in quantum physics / Henning F. Harmuth, Beate Meffert San Diego : Elsevier Academic Press , 2005
10 v. 143 Electron-beam-induced nanometer-scale deposition / edited by Natalia Silvis-Cividjian, Cornelis W. Hagen Amsterdam ; Tokyo : Elsevier Academic Press , c2006
11 v. 149 Electron emission physics / by Kevin L. Jensen Amsterdam ; Tokyo : Elsevier Academic Press , c2007
12 v. 153 Aberration-corrected electron microscopy / edited by Peter W. Hawkes Amsterdam ; Tokyo : Elsevier Academic Press , 2008
13 v. 154 Dirac's difference equation and the physics of finite differences / Henning F. Harmuth, Beate Meffert Amsterdam : Academic Press, an imprint of Elsevier , 2008
14 v. 155 Selected problems of computational charged particle optics / Dmitry Greenfield and Mikhail Monastyrskiy Amsterdam ; Tokyo : Elsevier Academic Press , 2009
15 v. 157 Optics of charged particle analyzers / Mikhail Yavor Amsterdam ; Tokyo : Elsevier , 2009
16 v. 159 Cold field emission and the scanning transmission electron microscope / edited by Peter W. Hawkes Amsterdam ; Tokyo : Elsevier Academic Press , 2009
17 v. 166 Theory of intense beams of charged particles / by Valeriy A. Syrovoy ; translated by Mikhail A. Monastyrskiy Amsterdam : Academic Press , 2011
18 v. 172, 173 Neutron and X-ray microscopy / by Jay Theodore Cremer, Jr pt. 1,pt. 2. - Amsterdam : Academic Press , 2012
19 v. 174 Silicon-based millimeter-wave technology : measurement, modeling and applications / guest editor, M. Jamal Deen Amsterdam : Academic Press , 2012
20 v. 176 The Wien filter / Katsushige Tsuno, Damaschin Ioanoviciu Amsterdam : Academic Press , c2013
21 v. 180 Aspects of streak image tube photography / Mikhail Ya. Schelev ... [et al.] Amsterdam : Academic Press , 2013
22 v. 184 Time-resolved electron diffraction : for chemistry, biology and materials science / Anatoli A. Ischenko, Sergei A. Aseyev Amsterdam : Academic Press , 2014
23 v. 189 The leptonic magnetic monopole : theory and experiments / Georges Lochak, Harald Stumpf ; editor-in-chief, Peter W. Hawkes Amsterdam ; Tokyo : Academic Press , 2015
24 v. 192 Analytical, approximate-analytical and numerical methods in the design of energy analyzers / Victor S. Gurov, Arman O. Saulebekov, Andrey A. Trubitsyn ; translated by Mikhail A. Monastyrskiy Amsterdam ; Tokyo : Academic Press , 2015
25 v. 194 Particles and waves in electron optics and microscopy / Giulio Pozzi Amsterdam : Academic Press, Elsevier , 2016
26 v. 195 Logarithmic image processing : theory and applications / Michel Jourlin Amsterdam : Academic Press, Elsevier , 2016
27 v. 214 Computer techniques for image processing in electron microscopy / edited by Martin Hÿtch and Peter W. Hawkes London : Academic Press , 2020
28 v. 216 Morphological image operators / edited by Martin Hÿtch and Peter W. Hawkes London : Academic Press, an imprint of Elsevier , c2020

書誌詳細を非表示

別書名 その他のタイトル:Advances in imaging and electron physics including proceedings CPO-10
著者標目 Hawkes, P. W. (Peter William), 1937-
Hÿtch, Martin
書誌ID 1000021812
NCID BA24211536