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＜Books＞
Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 / editors, A. Benninghoven ... [et al.]
(Springer series in chemical physics ; v. 36)
| Material Type | Books |
|---|---|
| Publisher | Berlin ; New York : Springer Verlag |
| Classification | LCC:QD96.S43 DC19:543/.0873 |
| Year | 1984 |
| Size | xv, 503 p. : ill. ; 24 cm |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
|---|---|---|---|---|---|---|
| 3F | G.W. | 429AA||Pc-Sec||1983 | 10176386 |
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| Notes | "Fourth International Conference on Secondary Ion Mass Spectrometry]"--Pref Includes bibliographical references and index |
|---|---|
| Authors | Benninghoven, A. International Conference on Secondary Ion Mass Spectrometry (4th : 1983 : Osaka, Japan) |
| Subjects | LCSH:Secondary ion mass spectrometry -- Congresses All Subject Search |
| ID | 1000055233 |
| NCID | BA06696320 |