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Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 / editors: A.Benninghoven...[et al.]
(Springer series in chemical physics ; 9)

Material Type Books
Publisher Berlin : Springer-Verlag
Classification LCC:QD96.S43
DC19:543/.0873
Year 1979
Size xiii, 295 p. : ill. ; 24 cm
URL

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3F U.S. 429AA||PC-Sec||1979 10176360

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Other titles other title:Proceedings of the International Conference(2nd, 1979)
Notes Includes bibliographies and index
Authors *International Conference on Secondary Ion Mass Spectrometry (2nd : 1979 : Stanford, Calif.)
Benninghoven, A.
Subjects LCSH:Secondary ion mass spectrometry -- Congresses  All Subject Search
ID 1000045177
NCID BA00565104

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