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Examining the submicron world / edited by Ralph Feder, J. Wm. McGowan and Douglas M. Shinozaki
(NATO ASI series ; ser. B . Physics ; v. 137)

Material Type Books
Publisher New York : Plenum Press
Classification LCC:QH212.E4
DC19:502/.8/25
Year c1986
Size xii, 372 p. : ill. ; 26 cm

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3F
428C||PC-Imp||1984 10186070

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Notes "Proceedings of a NATO Advanced Study Institute on Improved Methods for Examining the Submicron World, held July 28-August 11, 1984, in Nova Scotia"--T.p. verso
Includes bibliographies and index
Authors *NATO Advanced Study Institute on Improved Methods for Examining the Submicron World (1984 : Nova Scotia)
Feder, Ralph
McGowan, J. William (James William), 1931-
Shinozaki, Douglas M.
Subjects LCSH:Electron microscopy -- Congresses  All Subject Search
LCSH:X-ray microscope -- Congresses  All Subject Search
LCSH:Ultrastructure (Biology) -- Congresses  All Subject Search
ID 1000013240
NCID BA00602040

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