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＜Books＞
Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer
| Material Type | Books |
|---|---|
| Publisher | New York : North-Holland : Elsevier Science Pub. |
| Classification | LCC:QD506 DC19:530.4/1 |
| Year | c1986 |
| Size | xviii, 352 p. : ill. ; 24 cm |
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| Notes | Includes bibliographies and index |
|---|---|
| Authors | *Feldman, Leonard C. Mayer, James W., 1930- |
| Subjects | LCSH:Surfaces (Technology) -- Analysis
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LCSH:Thin films -- Analysis All Subject Search |
| ID | 1000012942 |
| NCID | BA0028903X |