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＜Books＞
Markov random field modeling in image analysis / Stan Z. Li
(Advances in pattern recognition)
| Material Type | Books |
|---|---|
| Publisher | London : Springer |
| Classification | DC22:621.36701519233 |
| Year | c2010 |
| Size | xxiii, 357 p. : ill. ; 24 cm |
| URL |
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| Notes | Includes bibliographical references (p. 315-350) and index |
|---|---|
| Authors | *Li, S. Z. |
| Subjects | LCSH:Image processing -- Digital techniques -- Mathematical models
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LCSH:Markov random fields |
| ID | 1100000588 |
| NCID | BC17004070 |