<Books>
Advances in pattern recognition
Material Type | Books |
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Publisher | London : Springer |
Year | 2001- |
Size | v. ; 24 cm |
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1 | Markov random field modeling in image analysis / Stan Z. Li : pbk.. - 3rd ed. - London : Springer , c2010 |
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Other titles | other title:APR |
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ID | 1100000587 |
NCID | BA5075055X |