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＜Books＞
Advances in pattern recognition
| Material Type | Books |
|---|---|
| Publisher | London : Springer |
| Year | 2001- |
| Size | v. ; 24 cm |
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| 1 | Markov random field modeling in image analysis / Stan Z. Li : pbk.. - 3rd ed. - London : Springer , c2010 |
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| Other titles | other title:APR |
|---|---|
| ID | 1100000587 |
| NCID | BA5075055X |