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＜Books＞
Optics of charged particle analyzers / Mikhail Yavor
(Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 157)
| Material Type | Books |
|---|---|
| Publisher | Amsterdam ; Tokyo : Elsevier |
| Year | 2009 |
| Size | xxiii, 381 p. : ill. ; 24 cm |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
|---|---|---|---|---|---|---|
| 3F |
|
540A||Adv||157 | 50014596 |
|
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| Notes | Includes bibliographical references (p. 351-371) and index |
|---|---|
| Authors | Yavor, Mikhail |
| ID | 1000078641 |
| NCID | BA90973345 |