<Books>
Optics of charged particle analyzers / Mikhail Yavor
(Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 157)
Material Type | Books |
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Publisher | Amsterdam ; Tokyo : Elsevier |
Year | 2009 |
Size | xxiii, 381 p. : ill. ; 24 cm |
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Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
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3F |
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540A||Adv||157 | 50014596 |
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Notes | Includes bibliographical references (p. 351-371) and index |
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Authors | Yavor, Mikhail |
ID | 1000078641 |
NCID | BA90973345 |