<Books>
Aberration-corrected electron microscopy / edited by Peter W. Hawkes
(Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 153)
Material Type | Books |
---|---|
Publisher | Amsterdam ; Tokyo : Elsevier Academic Press |
Year | 2008 |
Size | xv, 538 p., [32] p. of plates : ill. (some col.) ; 24 cm |
Hide book details.
Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
---|---|---|---|---|---|---|
3F |
|
540A||Adv||153 | 50013614 |
|
Hide details.
Notes | Includes bibliographical references and index |
---|---|
Authors | Hawkes, P. W. (Peter William), 1937- |
ID | 1000078623 |
NCID | BA88259270 |