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＜Books＞
Aberration-corrected electron microscopy / edited by Peter W. Hawkes
(Advances in imaging and electron physics / edited by Peter W. Hawkes ; v. 153)
| Material Type | Books |
|---|---|
| Publisher | Amsterdam ; Tokyo : Elsevier Academic Press |
| Year | 2008 |
| Size | xv, 538 p., [32] p. of plates : ill. (some col.) ; 24 cm |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
|---|---|---|---|---|---|---|
| 3F |
|
540A||Adv||153 | 50013614 |
|
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| Notes | Includes bibliographical references and index |
|---|---|
| Authors | Hawkes, P. W. (Peter William), 1937- |
| ID | 1000078623 |
| NCID | BA88259270 |