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Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt
| Material Type | Books |
|---|---|
| Publisher | Amsterdam ; New York : North-Holland : sole distributors for the U.S.A. and Canada, Elsevier North-Holland |
| Classification | LCC:TA417.23 DC:620.1/127 |
| Year | 1978 |
| Size | 2 v. (xvii, 847 p., [1] fold. leaf of plate) : ill. ; 23 cm |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
|---|---|---|---|---|---|---|
| 3F | v. 1 | 510A||Pc-Mat||1969-i | 10020576 |
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| 3F | v. 2 | 510A||Pc-Mat||1969-ii | 10020584 |
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| Contents | v. 1. Electron microscopy v. 2. Imaging and diffraction techniques |
|---|---|
| Notes | Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science Includes bibliographical references and index |
| Authors | Amelinckx, Severin Gevers, R. Landuyt, J. van International Summer Course on Material Science (1969 : Antwerp, Belgium) |
| Subjects | LCSH:Electron microscopy -- Congresses
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LCSH:Electrons -- Diffraction -- Congresses All Subject Search LCSH:Imaging systems -- Congresses All Subject Search |
| ID | 1000056875 |
| NCID | BA02904572 |