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＜図書＞
Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt
| データ種別 | 図書 |
|---|---|
| 出版者 | Amsterdam ; New York : North-Holland : sole distributors for the U.S.A. and Canada, Elsevier North-Holland |
| 分 類 | LCC:TA417.23 DC:620.1/127 |
| 出版年 | 1978 |
| 大きさ | 2 v. (xvii, 847 p., [1] fold. leaf of plate) : ill. ; 23 cm |
所蔵情報を非表示
| 配架場所 | 巻 次 | 請求記号 | 資料番号 | 状 態 | コメント | 予約 |
|---|---|---|---|---|---|---|
| 3F | v. 1 | 510A||Pc-Mat||1969-i | 10020576 |
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| 3F | v. 2 | 510A||Pc-Mat||1969-ii | 10020584 |
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書誌詳細を非表示
| 内容注記 | v. 1. Electron microscopy v. 2. Imaging and diffraction techniques |
|---|---|
| 一般注記 | Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science Includes bibliographical references and index |
| 著者標目 | Amelinckx, Severin Gevers, R. Landuyt, J. van International Summer Course on Material Science (1969 : Antwerp, Belgium) |
| 件 名 | LCSH:Electron microscopy -- Congresses
全ての件名で検索
LCSH:Electrons -- Diffraction -- Congresses 全ての件名で検索 LCSH:Imaging systems -- Congresses 全ての件名で検索 |
| 書誌ID | 1000056875 |
| NCID | BA02904572 |