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＜Books＞
Materials analysis by ion channeling : submicron crystallography / Leonard C. Feldman, James W. Mayer, S. Thomas Picraux
| Material Type | Books |
|---|---|
| Publisher | New York ; Tokyo : Academic Press |
| Classification | LCC:QC176.8.C45 DC19:620.1/1299 |
| Year | 1982 |
| Size | xix, 300 p. : ill. ; 24 cm |
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| Notes | Bibliography: p. 235-295 Includes index |
|---|---|
| Authors | *Feldman, Leonard C. Mayer, James W., 1930- Picraux, S. T., 1943- |
| Subjects | LCSH:Channeling (Physics) LCSH:Solids -- Surfaces All Subject Search LCSH:Crystals -- Defects All Subject Search LCSH:Ion beams LCSH:Crystallography |
| ID | 1000045430 |
| NCID | BA01369360 |