<Books>
An artificial intelligence approach to test generation / by Narinder Singh
(The Kluwer international series in engineering and computer science ; 19)
Material Type | Books |
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Publisher | Boston : Kluwer Academic Publishers |
Classification | LCC:TK7874 DC19:621.395 |
Year | c1987 |
Size | x, 193 p. : ill. ; 25 cm |
URL |
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Notes | Bibliography: p. [189]-193 |
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Authors | *Singh, Narinder, 1956- |
Subjects | LCSH:Integrated circuits -- Very large scale integration -- Testing -- Data processing
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LCSH:Expert systems (Computer science) LCSH:Artificial intelligence |
ID | 1000045279 |
NCID | BA00802083 |