Export Mendeley
＜Books＞
An artificial intelligence approach to test generation / by Narinder Singh
(The Kluwer international series in engineering and computer science ; 19)
| Material Type | Books |
|---|---|
| Publisher | Boston : Kluwer Academic Publishers |
| Classification | LCC:TK7874 DC19:621.395 |
| Year | c1987 |
| Size | x, 193 p. : ill. ; 25 cm |
| URL |
Hide details.
| Notes | Bibliography: p. [189]-193 |
|---|---|
| Authors | *Singh, Narinder, 1956- |
| Subjects | LCSH:Integrated circuits -- Very large scale integration -- Testing -- Data processing
All Subject Search
LCSH:Expert systems (Computer science) LCSH:Artificial intelligence |
| ID | 1000045279 |
| NCID | BA00802083 |