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＜図書＞
An artificial intelligence approach to test generation / by Narinder Singh
(The Kluwer international series in engineering and computer science ; 19)
| データ種別 | 図書 |
|---|---|
| 出版者 | Boston : Kluwer Academic Publishers |
| 分 類 | LCC:TK7874 DC19:621.395 |
| 出版年 | c1987 |
| 大きさ | x, 193 p. : ill. ; 25 cm |
| URL |
書誌詳細を非表示
| 一般注記 | Bibliography: p. [189]-193 |
|---|---|
| 著者標目 | *Singh, Narinder, 1956- |
| 件 名 | LCSH:Integrated circuits -- Very large scale integration -- Testing -- Data processing
全ての件名で検索
LCSH:Expert systems (Computer science) LCSH:Artificial intelligence |
| 書誌ID | 1000045279 |
| NCID | BA00802083 |