<Books>
Secondary ion mass spectrometry : SIMS II : proceedings of the second international conference, Stanford Univ.,Stanford, California, August 27-31, 1979 / editors: A.Benninghoven...[et al.]
(Springer series in chemical physics ; 9)
Material Type | Books |
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Publisher | Berlin : Springer-Verlag |
Classification | LCC:QD96.S43 DC19:543/.0873 |
Year | 1979 |
Size | xiii, 295 p. : ill. ; 24 cm |
URL |
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Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
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3F | U.S. | 429AA||PC-Sec||1979 | 10176360 |
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Other titles | other title:Proceedings of the International Conference(2nd, 1979) |
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Notes | Includes bibliographies and index |
Authors | *International Conference on Secondary Ion Mass Spectrometry (2nd : 1979 : Stanford, Calif.) Benninghoven, A. |
Subjects | LCSH:Secondary ion mass spectrometry -- Congresses All Subject Search |
ID | 1000045177 |
NCID | BA00565104 |