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Computed electron micrographs and defect identification / A. K. Head ... [et al.]
(Defects in crystalline solids ; v. 7)
| Material Type | Books |
|---|---|
| Publisher | Amsterdam ; London : North-Holland |
| Publisher | New York : American Elsevier |
| Classification | LCC:QD921 DC:548/.842/02854 |
| Year | 1973 |
| Size | x, 400 p. with illus ; 23 cm |
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| Notes | Bibliography: p. [387]-389 |
|---|---|
| Authors | Head, A. K. |
| Subjects | LCSH:Metals -- Defects -- Data processing
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LCSH:Electron microscopy -- Data processing All Subject Search |
| ID | 1000014632 |
| NCID | BA07250178 |