<Books>
Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer
Material Type | Books |
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Publisher | New York : North-Holland : Elsevier Science Pub. |
Classification | LCC:QD506 DC19:530.4/1 |
Year | c1986 |
Size | xviii, 352 p. : ill. ; 24 cm |
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Notes | Includes bibliographies and index |
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Authors | *Feldman, Leonard C. Mayer, James W., 1930- |
Subjects | LCSH:Surfaces (Technology) -- Analysis
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LCSH:Thin films -- Analysis All Subject Search |
ID | 1000012942 |
NCID | BA0028903X |