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＜Books＞
Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering
(Advances in electronics and electron physics ; Supplement 20)
| Material Type | Books |
|---|---|
| Publisher | Boston : Academic Press |
| Classification | NDC7:549 |
| Year | c1989 |
| Size | vii, 299 p : ill. ; 24 cm |
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| Location | Volume | Call No. | Barcode No. | Status | Comments | Reserve |
|---|---|---|---|---|---|---|
| 3F |
|
540A||Adv||S-20 | 10082279 |
|
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| Notes | Bibliography: p. 275-292 Includes index |
|---|---|
| Authors | 酒井, 明 <サカイ, アキラ> Pickering, H. W. 桜井, 敏雄(1927-) <サクライ, トシオ> |
| ID | 1000011116 |
| NCID | BA06995219 |