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＜図書＞
Transmission electron microscopy : diffraction, imaging, and spectrometry / C. Barry Carter, David B. Williams (eds.) ; [foreword by Sir John Meurig Thomas]
| データ種別 | 図書 |
|---|---|
| 出版情報 | Berlin : Springer , c2016 |
| 大きさ | xxxiii, 518 p. : ill. (some col.), ports. ; 29 cm |
| URL |
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| 一般注記 | "This text is a companion volume to Transmission electron microscopy : a textbook for materials sciences by Williams and Carter."--P. [4] of cover Includes bibliographical references and index |
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| 著者標目 | Carter, C. Barry *Williams, David B. (David Bernard), 1949- Thomas, J. M. (John Meurig) |
| 書誌ID | 1000087836 |
| NCID | BB22301599 |